PHABRIX demonstrates the Qx Series’ new SDI-STRESS option at NAB 2019 booth N4508. The SDI-STRESS option provides an advanced toolset for SDI interface stress testing. Alongside the automated 12G-SDI physical layer analysis employing RTE™ (Real-Time Eye) technology, the SDI-STRESS creates a world-class solution to SMPTE compliance verification of 12G/4x3G/2x6G/6G/3G/HD-SDI interfaces.
The SDI-STRESS toolset includes full and windowed eye amplitude histograms with Peak or Mean measurement of eye amplitude. Additionally, it includes SDI jitter insertion (10Hz to 10MHz, 0.01UI to 16UI), eye amplitude adjustment (+/-10%), risetime, pre-emphasis, signal invert and mute controls operating with the video pattern generator with pathological overlay as source or a new PRBS Signal Generator (PRBS7, 9, 15, 23, 31), coupled with a new BERT Analyzer tool.
A new Pathological EQ/PLL condition detector with realtime trigger over GPI out is also provided all under REST API control.
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